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FABRICATION OF ARRAYS OF NANOMETER-SIZE TEST STRUCTURES FOR SCANNING PROBE MICROSCOPE TIPS CHARACTERIZATION
A. BOGDANOV et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 12 (6), 3681-4
Posted by hakanolin to shape reconstruction Images rough surfaces TUNNELING MICROSCOPY atomic-force microscopy on Fri Mar 07 2008 at 21:51 UTC | info | related

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