Marohn's bookmarks matching tag mrfm
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Intrinsic Noise Properties of Atomic Point Contact Displacement DetectorsN Flowers-Jacobs, D Schmidt, and K Lehnert
Physical Review Letters 98 (9), 096804 (2007)
Magnetic exchange force microscopy with atomic resolutionUwe Kaiser, Alexander Schwarz, and Roland Wiesendanger
Nature 446 (7135), 522-5 (29 Mar 2007)
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