Connotea: Loll's bookmarks matching tag "Cesium concentration"

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SIMS (created by Loll)

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18-Methyleicosanoic acid (18-MEA)

3D island-like growth

5-Trichlorophenoxyac- etic acid

absorbed proteins

AC plasma polymerisation

achievable lateral resolution in SIMS imaging

Acid�base salt

Aluminium metallisation

Amorphous surfaces

Amount of substance (AOS)

Anisotropic silicon etching

Associative ionization

Atomic-scale point contacts

Beam-induced damage

biocompatibility

Biological molecules-proteins

Biological sample

Bis-phenol-A polycarbonate

block copolymer

Caesium bombardment

Carbocyanine dye

Carbon quantification

Cation Mass Spectrometer

Cesium concentration

Cesium deposition

Cesium evaporator

Cesium surface concentration

Charge neutralization

charge transfert of secondary ions

Chemical derivatization

Cluster bombardment

cluster density

cluster sputtering

collision cascade

Comparison of surface problem

Computer modeling & simulation

Computer Simulation

condensation coefficient

contrast mechanisms in SIMS imaging

Cs concentration

cyclic oligomers

Damage Cross Section

deposition of Cs

Depth profiling

Depth resolution

Diffusible elements

Disapperance crosssection

double layer system

Dynamic secondary ion mass spectrometry

Ejection radius

ELASTIC SCATTERING

Electrocatalysis

Electrochemical growth

Electron damage

electronegativity

Ellipsometry of films

Energy dissipation

Epoxy surface modification

Evaporation and sublimation

extracellular matrix

Ferroelectric properties

Film quality spin-coating

Fingerprint detection

First principles

Formation kinetics of thin films

Fragment pattern

free standing polymers

functionalization

Ga primary ion ToF-SIMS

glass transition

Glass-ceramic thin film disk substrate

Gold agglomerates

Gold deposition

Gold nano-clusters

Gold nanoparticle

gold nanoparticles

Graft polymerization

growth mechanism

growth simulation

Guanidine resin

Heterojunctions

Hydrocarbon contamination

Imaging mass spectrometry

Imaging ToF-SIMS

In-depth distribution of atoms

information theory

Inorganic compounds

instrumentation

Instrumentation for time-of-flight mass spectrometry (ToF-SIMS)

interface mixing

interface states

Internal energy

ion beam etching

Ion beam modification

Ion bombardment

Ion irradiation

Ionic potentials

Ionized cluster beam

Ion�solid interactions

Isotope tracing

Kinetic energy distribution

Kinetic energy distribution (KED)

Kinetic energy distributions

Langmuir-Blodgett films

laser ablation mass spectrometry

Laser ablation of solids

Laser induced periodic surface structure

layer thickness

Layer-by-layer growth

low-voltage SEM

Magnetic recording disk

Magnetic sector

Magnetron sputtering

Matrix-enhanced SIMS

Metal cationization

Metal deposition

Metal diffusion

Metal nanoparticles

Metal-assisted SIMS

Metal-assisted SIMS (MetA-SIMS)

Metal�semiconductor interfaces

Microscopy (AFM

Microstructures

Microwave plasma etching

molecular dynamics

Molecular dynamics computer simulations

Molecular dynamics simulations

Molecular emission

Molecular solid

Molecular solids

Molecular weight evaluation

molecule & ion impact

Monte Carlo calculations

Montmorillonite

Multiphoton ionization

Multivariate Analysis

mutual information

nano-structures

Nanofabrication

nanosize clusters

Neutral cesium deposition

Neutral Cs deposition

non-fouling coatings

Optical coatings

optoelectronic devices

Organic additives

Organic collectors

Organic materials

Organic overlayer

Organic overlayers

Organic Semiconductors

Organometallics

Oxygen bombardment

Parallel detection

Particle-induced desorption

peak shape analysis

Perfluoroalkyl polyether

Phosphoric acid

Photoelectron spectroscopy

Photoionization of atoms

Photoionization of molecules

Physical adsorption

Plasma polymerization

Plasma source ion implantation

Plasma treatment

Poly(ethylene terephthalate)

Poly(methyl methacrylate) films

Poly-dimethylsiloxan- e

Polyatomic bombardment

Polyethyleneterephth- alate (PET)

Polymer additives

Polymer concentration

Polymer filmmetal interface

Polymer metal intermixing

polymer metallization

polymer surfaces

Polymers spin-coating

Polyvinylbutyral

Post-ionization

Precursor model

Principal Component Analysis

principle component analysis

Profile broadening

protein adsorption

proton conductivity

pulsed laser deposition

Quantitative analysis

quantitative surface analysis

quantized conductance

radiation damage

Rapid screening

Reverse development

Ripple formation

Ripple topography

Sample preparation

Sampling interval

Scanning tunnelling microscopy (STM)

Scanning tunnelling spectroscopies (STS)

Scattered-beam interference

Secondary ion mass spectrometry

Secondary ion mass spectrometry (SIMS)

secondary ion mass spectroscopy

Secondary ion spectrometry (SIMS)

Secondary ion yield

Secondary-ion mass spectrometry (SIMS)

SELF-ASSEMBLED MONOLAYERS

self-organization

Self-organized structures

Shear and stretch field

Silicon oxide spin-coating

Silver cationization

silver deposition

Silver doposition

solvent casting

Spectra interpretation

Spin-coated films

Sputtering by atom

Sputtering yield

sputtering yields

static ToF SIMS

Static ToF-SIMS

Stranski-Krastanow

structural characterization

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