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XANES studies of Mn K and L-3,L-2 edges in the (Ga,Mn) As layers modified by high temperature annealing
A. Wolska et al.
Acta Physica Polonica A 114 (2), 357-66 (Aug 2008)
Ga1-xMnx As is commonly considered as a promising material for microelectronic applications utilizing the electron spin. One of the ways that allow increasing the Curie temperature above room temperature is to produce second phase inclusions. In this paper Gal-,Mn.As samples containing precipitations of ferromagnetic MnAs are under consideration. We focus on the atomic and electronic structure around the Mn atoms relating to the cluster formation. The changes in the electronic structure of the Mn, Ga and As atoms in the (Ga,Mn)As layers after high temperature annealing were determined by X-ray absorption near edge spectroscopy. The experimental spectra were compared with the predictions of ab initio full multiple scattering theory using the FEFF 8.4 code. The nominal concentration of the Mn atoms in the investigated samples was 6% and 8%. We do not observe changes in the electronic structure of Ca and As introduced by the presence of the Mn atoms. We find, in contrast, considerable changes in the electronic structure around the Mn atoms. Moreover, for the first time it was possible to indicate the preferred interstitial positions of the Mn atoms.
 
Non-blinking semiconductor nanocrystals
Xiaoyong Wang et al.
Nature 459 (7247), 686-9 (04 Jun 2009)
 
EXCITONS IN CONJUGATED OLIGOMER AGGREGATES, FILMS, AND CRYSTALS
Annual Review of Physical Chemistry 57 (1), 217 (2006)
 
Femtosecond gain and index dynamics in an InAs/InGaAsP quantum dot amplifier operating at 1.55 �m
Femtosecond gain and index dynamics in an InAsInGaAsP quantum dot amplifier operating at 155 µm
Aaron Zilkie et al.
 
Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study
D. Pastre and M. Troyon
J. Appl. Phys. 86 (8), 4326-32 (Oct 1999)
 
Static and growing InP and InAs surfaces: reflection-anisotropy spectroscopy under the conditions of solid-source MBE
K. Ozanyan et al.
Thin Solid Films 364 (1-2), 6-11 (Mar 2000)
This presentation gives a current overview of the results obtained in situ and in real time by reflection-anisotropy (RA) spectroscopy, and complemented by RHEED, in the P-capable MBE machine at Sheffield. Recent work dedicated to InP and InAs, as less investigated materials, is examined. Particular emphasis is put on the different phases in the static surface-phase diagrams, as well as the possibility to observe growth oscillations. The low-temperature c(4x4) surface reconstruction on (001)InP displays a RA signature with P-dimers along [110] as opposed to the conventional model derived from the GaAs case. The newly observed by RA spectroscopy [gamma](2x4) phase in InAs, confirmed by other groups? calculations, appears as the lowest temperature reconstruction observed in this material. The transition towards the less As-rich and higher temperature phase, [beta](2x4), takes place over a wide temperature region, exhibiting a ?solid-solution?-type behaviour between the two phases. Monolayer growth oscillations in the time-resolved RA signal are observed for both InP and InAs. The RA signal shows that upon operating the group-III beam shutter the surface stoichiometry changes much quicker than one monolayer period. This is discussed in conjunction with existing literature on STM of static surfaces, and in the case of InP a model for the sequence of the surface reconstructions during the monolayer growth cycle is suggested.
 
Fundamentals and applications of isotope effect in solids
Vladimir Plekhanov
Progress in Materials Science 51 (3), 287 (2006)
 
Shallow excited states of deep luminescent centers in silicon
Mandeep Singh et al.
Solid State Communications 93 (5), 415-8 (1995)
 
Semiconductors: Data Handbook
Otfried Madelung
Book of data on various semiconduction materials.
Posted by arrich to semiconductors reference on Fri Aug 08 2008 at 07:34 UTC | info | related
 
National Semiconductors - Thermal Management & Temperature Sensors
www.national.com

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